#AFMWorkshop

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Atomic Force Microscopy News from AFMWorkshop. Stay up to date with AFMWorkshop and the industry, including tips on how to create the best AFM scans, customer success stories, new products, advancements in the industry, and special deals.

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AFM is a powerful method for imaging polymers, polymer blends, and polymer composites with nanometer lateral resolution. For polymer applications, the AFM now resides alongside optical microscopy and electron microscopy (SEM – scanning electron microscopy and TEM – transmission electron microscopy) as essential tools for characterization. Call us at : 1 (888) 671-5539 or email us:info@afmworkshop.com

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How Atomic Force Microscope Is Useful In The Study Of Polymers

AFM is a powerful method for imaging polymers, polymer blends, and polymer composites with nanometer lateral resolution. For polymer applications, the AFM now resides alongside optical microscopy and electron microscopy (SEM – scanning electron microscopy and TEM – transmission electron microscopy) as essential tools for characterization. However, atomic force microscopy provides specific advantages over other microscopies because it provides mechanical interaction between the tip and sample. This mechanical source contrast often provides contrast in situations where electron or photon based microscopies struggle or even fail.

The predominant mode for imaging polymers is phase imaging, which is associated with vibrating mode. In phase imaging, the AFM provides excellent contrast, sensitivity, and discrimination based on various material properties of the polymers.

Key Benefits of AFM

Suitable for polymers, polymer blends, polymer composites

Used to establish structure-property relationships

Lateral resolution is ~10nm

Information obtained includes morphology, dispersion, domain size, internal structure

Sample preparation – cryo-microtoming - often needed to remove skin effects from molding, other processing methods

Phase imaging is excellent method for contrast where contrast is based on material/mechanical properties such as stiffness and adhesion

No post processing needed

Phase Imaging

The predominant mode for imaging polymers is phase imaging, which is associated with vibrating mode. In phase imaging, the AFM provides excellent contrast, sensitivity, and discrimination based on various material properties of the polymers including stiffness and adhesion.

Phase imaging is a channel collected in vibrating mode and requires no post processing. Phase imaging collects the information on the phase shift (Φ) induced in the cantilever vibration motion. The cantilever is driven at a resonant frequency and interacts with the sample at a given oscillation amplitude set by the user. The phase shift (Φ) is then induced by interacting with the sample and is mapped as a channel simultaneously with the topography channel while the tip raster scans over the surface. A variety of material properties can affect the tip-sample interaction and induce a phase shift including stiffness, adhesion, viscoelasticity, and capillary forces.

Sample Preparation

AFM imaging requires flat surfaces for imaging. However, polymer samples may require additional sample preparation beyond this. If there is a sample with a "skin", or a sample that has been processed and only the inner bulk material needs to be imaged, it may help to use a micro tome for sample prep. Microtoming is a process by which a very smooth surface is cut and prepared. Many samples such as thin films or spin-coated films can be imaged as is without this preparation.

Aside from microtoming, no further sample preparation is required – i.e. no staining is required as is the case for electron microscopy based methods such as scanning electron microscopy (SEM) and transmission electron microscopy (TEM).

Our AFM Users Recent Polymer Reference Publications

AFMWorkshop's TT-AFM provides all the major Atomic Force Microscopy (AFM) modes needed to characterize polymers, including vibrating mode for topography/morphology and force distance curves for mechanical properties such as adhesion and stiffness. A number of researchers have published their work on polymers using the TT-AFM, characterizing important properties such as size, shape, and dispersion. Click here  to read our highlights of a few recent articles where researchers are utilizing the TT-AFM for work on polymers in biomedical and electronic device applications.

To learn more about afmworkshop’s atomic force microscopes, feel free to visit www.afmworkshop.com.

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The LS-AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope. To learn, visit our website: https://www.afmworkshop.com/applications/research/atomic-force-microscope-for-life-sciences

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AFM Training Programs - An Overview!

TT-2 Assembly Workshop

The ultimate in comprehensive knowledge of Atomic Force Microscope design and function can be gained through AFMWorkshop's TT-AFM Assembly Workshop. Participants build their own AFM and participate in numerous workshops on AFM theory, operation, and applications. Attendees learn the components of an Atomic Force Microscope, how an AFM operates, key AFM design points, light lever design, scanner design/construction, and how to maximize image signal-to-noise ratio.

 AFM Applications Workshop

AFMWorkshop's five-day AFM Applications Workshop provides access to an AFM for each attendee for extensive hands-on labs. Participants spend time in group lectures on the theory of Atomic Force Microscopy, and put theory into practice by preparing and measuring images for a wide variety of metallurgic and life sciences samples. Participants have time for expert guidance in troubleshooting their particular applications.

 Free Atomic Force Microscopy Webinars

AFMWorkshop provides a series of free live-streaming seminars for educators and professionals. Key skills to help all AFM users gain the most from their AFM are covered, including effective utilization of image processing software, techniques for successful sample preparation, detecting artifacts, and selecting the right probes. To view pre-recorded webinars, visit the AFMWorkshop Webinar Page.

 Animated AFM Tutorials

Learning how an atomic force microscope works is an essential part of proper Atomic Force Microscope training. AFMWorkshop provides a series of animations that illuminate key operating principles and efficiently introduce new users to Atomic Force Microscopes.

While minimal training is needed to measure basic AFM images, gaining optimal performance requires greater insight into the operating principles and design of atomic force microscopes. This depth of understanding is especially necessary when users need to measure high-quality images with only a few angstroms of resolution.

Concepts essential to understanding how to optimize AFM performance, such as the design of piezoelectric scanners, light lever design, probe sample interactions, and feedback control can be readily understood by the AFM user and are clearly illustrated in the AFMWorkshop Animated AFM Tutorials.

Our tutorials act as a starting point for anyone interested in learning about the theory and operation of atomic force microscopes. For example, in the section of animations describing the "Design of the Light Lever AFM," we first show that a photodetector can convert photons to electrical energy; then demonstrate how 2 photodetectors are used to create a position-sensitive detector; finally show how the motion of a cantilever is measured with a light lever. Researchers, educators, and students around the globe have voiced their appreciation for the unique and immediately useful knowledge communicated through the AFMWorkshop animated tutorials.

Atomic Force Microscopy Textbook

The book Atomic Force Microscopy, written by Drs. Peter Eaton and Paul West and published by Oxford University Press, is available from Amazon.com, or Oxford University Press. Atomic Force Microscopy has become the leading text for AFM education and is a great resource for both professionals and students. Click Here for more information.

Presentations

AFMWorkshop customers have access to a complete library of PowerPoint presentations, including over 500 slides on subjects ranging from AFM image analysis, instrument design, quantitative AFM measurements, and Atomic Force Microscope image artifacts. These presentations may be used for teaching courses to undergraduate and graduate students. Additionally, a trained instructor from the AFMWorkshop is available to lead a three day course derived from these PowerPoint presentations.

Training for AFM Success

Pick up any scientific journal or click through a website and you'll see beautiful images produced by scientists and engineers on atomic force microscopes. What's not so easy to see is the amount of time and effort that went into producing these amazing images.

Training, education,and time on the instrument are the keys to successful AFM imaging. Although basic operation of the instrument is straightforward, acquiring beautiful nano-scale images like those seen in scientific publications requires theoretical knowledge as well as actual practice time on the instrument.

AFMWorkshop is committed to helping our customers develop the strong AFM skill sets necessary to produce world-class AFM images.

To learn more about atomic force microscopes training, feel free to visit www.afmworkshop.com

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Global Delivery Of Atomic Force Microscopes First Class Training. To Know More Visit :  https://afmworkshop.com/

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AFMWorkshop - International On-Site AFM Installation And Training

For those AFMWorkshop customers outside of the USA electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

Once the new AFMWorkshop AFM is received at your facility, an authorized AFMWorkshop customer service engineer travels to your facility to install the AFM and to train your AFM users on the particular model's operative techniques.

AFMWorkshop's on-site training is designed for up to two designated operators of the AFM. These operators are then designated as the primary contact points between AFMWorkshop and the customer's institution. During the installation and training visit, the focus is on training customers how to make optimal images of standard samples, not on specific applications. We find that this approach yields the best results for future success with the AFM. (If your facility's AFM operators are interested in continuing their training on specific applications, AFMWorkshop offers five-day advanced applications workshops throughout the year.)

Day 1 The objective is to set up the AFM and ensure it is operating to factory specifications. The AFM's proposed location is reviewed and remedies to any potential negative ambient impacts on the AFM's performance are discussed.

⦁ Unpack AFM ⦁ Set up AFM ⦁ Evaluate AFM site for acoustic and structural vibrations ⦁ Verify system specifications

Day 2 The objective is to train up to two operators on the skills required to operate the AFM and to make images of standard samples. Skills reviewed include:

⦁ Changing samples ⦁ Changing probes ⦁ Aligning the light lever ⦁ Positioning the photodetector ⦁ Selecting resonance (vibrating mode only) ⦁ Tip approach ⦁ Scanning ⦁ Optimizing GPID ⦁ High resolution scanning on the AFMWorkshop product

The final component to the AFMWorkshop On-Site Installation and Training is the preparation of a service installation report, completed and signed by both the installation engineer and the customer at the end of Day 2. This report verifies that the instrument is properly functioning and/or makes note of any problems that may need further attention. After the installation, follow-up questions should be primarily directed to the AFMWorkshop service engineer who performed the installation, and come through one of your facility's two designated AFM users receiving the training.

AFMWorkshop covers all travel costs as well as room and board for the customer service engineer. We request a minimum of two weeks advance notice to schedule the installation.

To learn more about our AFM Installation Training programs, feel free to visit www.afmworkshop.com.

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Samples are held in place on this scanner with a removable cap. This modified tripod scanner utilizes low voltage piezoelectric ceramics and temperature compensated strain gauges. Connections to the scanner are made with a 20-pin ribbon cable.

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Atomic Force Microscope

Do you want to learn basic concepts of AFM operation? Attend two-day AFM course with lab work on atomic force microscopy operation.

To get answers for all these questions, visit:  https://bit.ly/2GUfSRr

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Atomic Force Microscopes have a range of applications from nanotechnology and biology to engineering and semiconductors. AFMs are an essential technology applied by scientists and researchers for visualizing nanostructures and making measurements at the nanoscale including surface roughness and step-height measurements.

For more information, feel free to visit: https://bit.ly/2HVdhqP

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Throughout the world, AFMWorkshop products are used everyday for nanotechnology research projects in both life and physical sciences.

To know more, visit our website: https://bit.ly/2vuAOrO

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Atomic Force Microscopes

The technology behind atomic force microscopes has been developed by pioneering scientists and engineers at leading technology firms, government labs, and universities throughout the world. AFMs continue to evolve and advance as scientists require higher resolution topographic scanning.

For more details, visit here: https://bit.ly/2xkML4d

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The technology behind atomic force microscopes has been developed by pioneering scientists and engineers at leading technology firms, government labs, and universities throughout the world. AFMs continue to evolve and advance as scientists require higher resolution topographic scanning.

For more details, visit here: https://bit.ly/2xkML4d

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Atomic Force Microscope

Standalone AFM For large samples and industry: The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete AFM system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated with inverted microscopes.

For more details, visit here: https://afmworkshop.com/afm-products/atomic-force-microscopes/sa-afm

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Atomic Force Microscopes

Life Sciences AFM For soft-sample applications: The LS-AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.

To learn, visit our website: https://afmworkshop.com/afm-products/atomic-force-microscopes/ls-afm

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Nano-Profiling AFM For process control and development: The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.

To know more, visit our website: https://afmworkshop.com/afm-products/atomic-force-microscopes/np-afm