#atomicforcemicroscope

[anikaroberson]

Labtron Atomic Force Microscope combines a scan head and sample stage for excellent anti-vibration performance. With 0.2 nm X/Y and 0.05 nm Z resolution, 360° scan angle, optical observation system, and CCD auto-focus via servomotor.

[afmworkshop]

The LS-AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope. To learn, visit our website: https://www.afmworkshop.com/applications/research/atomic-force-microscope-for-life-sciences

[forensicfield]

Atomic force microscope–

Atomic force microscopy or scanning force microscopy is a very-high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Fingerprint- A fingerprint is an impression left by the friction ridges of a human finger. The recovery of partial fingerprints from a crime scene is an important method of forensic science. Moisture and grease on a finger result in fingerprints on surfaces such as glass or metal.

Cartridge case- Cartridge cases are most commonly made of brass, although steel is also widely used, and cases for shotgun pellets are made of brass and cardboard. ————————– #forensic #forensicscience #forensics #forensicfield #forensicballistic #microscope #microscopy #cartridge #cartridgecases #firearms #fingerprints #generalforensicscience #forensicknowledge #gk #fact #crime #legal #law #court #evidence #physicalevidence #traceevidence #forensicphotography #atomicforcemicroscope https://www.instagram.com/p/B0m8_KTla12/?igshid=1m06rns5a1v4c

[anikaroberson]

Labtron Atomic Force Microscope features a combined scan head and sample stage for strong anti-vibration performance. It offers a 20 µm X/Y scan range, 4x CCD magnification, and high resolution of 0.2 nm (X/Y) and 0.05 nm (Z).

[afmworkshop]

The B-AFM is a complete system that includes a computer with software, a stage, and control electronics; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage.

For more details,visit here: https://www.afmworkshop.com/afm-products/atomic-force-microscopes/b-afm

[afmworkshop]

Vibration Solutions for Reduced External Vibrations and High-Quality AFM Images

Atomic force microscope vibration solutions offer a way to reduce external vibration that often cause fuzzy AFM images. AFMs are quite susceptible to external vibrations, which allows them to measure topographic data at resolutions below 0.1 nanometers. To reduce external vibrations and obtain the highest-quality AFM images, particularly for high-resolution scanning, AFMWorkshop has designed a variety of proven options for vibration isolation including: vibration tables, vibration enclosures, bungee options, and even custom/OEM enclosures.

Acoustic and structural vibrations degrade the resolution and overall performance of an Atomic Force Microscope. External vibration can affect the resolution of scans by adding extra noise. Vibration Isolation Our Solutions filters out unwanted acoustic structural vibrations that interfere with high-resolution scanning.

Acoustic vibrations are reduced by placing the microscope in an acoustic isolation chamber. Structural vibrations are reduced by using a mechanical isolation platform. Below are the vibration solution products offered by AFMWorkshop.

Passive Vibration Table

A Moderate structural vibration isolation is possible with the Passive Vibration Platform. This product is ideal if the AFM location has few structural vibrations and when ultimate AFM performance is not necessary. The Passive Table may be used in the acoustic isolation cabinet.

Active Vibration Table

An Active Vibration Table uses a feedback control method for removing vibrations for better quality scans. An acceleration sensor measures vibrations, and then electro mechanical transducers use the output of the sensors to control the motion of the table top. The advantage of an Active Vibration Table over the Bungee option is that the Vibration Table top is more stable than a platform suspended with bungee cords.

Bungee Option

Bungee Option is a relatively cost-effective method for reducing unwanted structural vibrations and improving the quality of AFM Image.

Bungee Option is additional Vibration Solution for Acoustic Enclosure. Such combination allows in comparatively cost-effective way reducing structural mechanical vibrations and Acoustical noises and obtaining better quality AFM pictures and scans.

Vibration Cabinet

Vibration isolation is essential for high-resolution AFM scanning. Vibrations from buildings, tables, and external vibration can affect the resolution of scans by adding extra noise. To further reduce vibration, we recommend a vibration isolation cabinet.

Custom/OEM vibration enclosure

Customized (OEM) Vibration enclosure - scalable vibration solution for any Atomic Force Microscopy System. To learn more about AFMWorkshop, feel free to visit, www.afmworkshop.com Or call us at 1 (888) 671-5539.

[afmworkshop]

AFMWorkshop has extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications. To learn, visit our website: https://www.afmworkshop.com/afm-products/training

[afmworkshop]

AFM Training Programs - An Overview!

AFMWorkshop is committed to helping our customers develop the strong AFM skill sets necessary to produce world-class AFM images.

To learn more about atomic force microscopes training, feel free to visit www.afmworkshop.com

[afmworkshop]

AFM Training Programs - An Overview!

TT-2 Assembly Workshop

The ultimate in comprehensive knowledge of Atomic Force Microscope design and function can be gained through AFMWorkshop's TT-AFM Assembly Workshop. Participants build their own AFM and participate in numerous workshops on AFM theory, operation, and applications. Attendees learn the components of an Atomic Force Microscope, how an AFM operates, key AFM design points, light lever design, scanner design/construction, and how to maximize image signal-to-noise ratio.

 AFM Applications Workshop

AFMWorkshop's five-day AFM Applications Workshop provides access to an AFM for each attendee for extensive hands-on labs. Participants spend time in group lectures on the theory of Atomic Force Microscopy, and put theory into practice by preparing and measuring images for a wide variety of metallurgic and life sciences samples. Participants have time for expert guidance in troubleshooting their particular applications.

 Free Atomic Force Microscopy Webinars

AFMWorkshop provides a series of free live-streaming seminars for educators and professionals. Key skills to help all AFM users gain the most from their AFM are covered, including effective utilization of image processing software, techniques for successful sample preparation, detecting artifacts, and selecting the right probes. To view pre-recorded webinars, visit the AFMWorkshop Webinar Page.

 Animated AFM Tutorials

Learning how an atomic force microscope works is an essential part of proper Atomic Force Microscope training. AFMWorkshop provides a series of animations that illuminate key operating principles and efficiently introduce new users to Atomic Force Microscopes.

While minimal training is needed to measure basic AFM images, gaining optimal performance requires greater insight into the operating principles and design of atomic force microscopes. This depth of understanding is especially necessary when users need to measure high-quality images with only a few angstroms of resolution.

Concepts essential to understanding how to optimize AFM performance, such as the design of piezoelectric scanners, light lever design, probe sample interactions, and feedback control can be readily understood by the AFM user and are clearly illustrated in the AFMWorkshop Animated AFM Tutorials.

Our tutorials act as a starting point for anyone interested in learning about the theory and operation of atomic force microscopes. For example, in the section of animations describing the "Design of the Light Lever AFM," we first show that a photodetector can convert photons to electrical energy; then demonstrate how 2 photodetectors are used to create a position-sensitive detector; finally show how the motion of a cantilever is measured with a light lever. Researchers, educators, and students around the globe have voiced their appreciation for the unique and immediately useful knowledge communicated through the AFMWorkshop animated tutorials.

Atomic Force Microscopy Textbook

The book Atomic Force Microscopy, written by Drs. Peter Eaton and Paul West and published by Oxford University Press, is available from Amazon.com, or Oxford University Press. Atomic Force Microscopy has become the leading text for AFM education and is a great resource for both professionals and students. Click Here for more information.

Presentations

AFMWorkshop customers have access to a complete library of PowerPoint presentations, including over 500 slides on subjects ranging from AFM image analysis, instrument design, quantitative AFM measurements, and Atomic Force Microscope image artifacts. These presentations may be used for teaching courses to undergraduate and graduate students. Additionally, a trained instructor from the AFMWorkshop is available to lead a three day course derived from these PowerPoint presentations.

Training for AFM Success

Pick up any scientific journal or click through a website and you'll see beautiful images produced by scientists and engineers on atomic force microscopes. What's not so easy to see is the amount of time and effort that went into producing these amazing images.

Training, education,and time on the instrument are the keys to successful AFM imaging. Although basic operation of the instrument is straightforward, acquiring beautiful nano-scale images like those seen in scientific publications requires theoretical knowledge as well as actual practice time on the instrument.

AFMWorkshop is committed to helping our customers develop the strong AFM skill sets necessary to produce world-class AFM images.

To learn more about atomic force microscopes training, feel free to visit www.afmworkshop.com

[afmworkshop]

How Atomic Force Microscope Is Useful In The Study Of Polymers

AFM is a powerful method for imaging polymers, polymer blends, and polymer composites with nanometer lateral resolution. For polymer applications, the AFM now resides alongside optical microscopy and electron microscopy (SEM – scanning electron microscopy and TEM – transmission electron microscopy) as essential tools for characterization. However, atomic force microscopy provides specific advantages over other microscopies because it provides mechanical interaction between the tip and sample. This mechanical source contrast often provides contrast in situations where electron or photon based microscopies struggle or even fail.

The predominant mode for imaging polymers is phase imaging, which is associated with vibrating mode. In phase imaging, the AFM provides excellent contrast, sensitivity, and discrimination based on various material properties of the polymers.

Key Benefits of AFM

Suitable for polymers, polymer blends, polymer composites

Used to establish structure-property relationships

Lateral resolution is ~10nm

Information obtained includes morphology, dispersion, domain size, internal structure

Sample preparation – cryo-microtoming - often needed to remove skin effects from molding, other processing methods

Phase imaging is excellent method for contrast where contrast is based on material/mechanical properties such as stiffness and adhesion

No post processing needed

Phase Imaging

The predominant mode for imaging polymers is phase imaging, which is associated with vibrating mode. In phase imaging, the AFM provides excellent contrast, sensitivity, and discrimination based on various material properties of the polymers including stiffness and adhesion.

Phase imaging is a channel collected in vibrating mode and requires no post processing. Phase imaging collects the information on the phase shift (Φ) induced in the cantilever vibration motion. The cantilever is driven at a resonant frequency and interacts with the sample at a given oscillation amplitude set by the user. The phase shift (Φ) is then induced by interacting with the sample and is mapped as a channel simultaneously with the topography channel while the tip raster scans over the surface. A variety of material properties can affect the tip-sample interaction and induce a phase shift including stiffness, adhesion, viscoelasticity, and capillary forces.

Sample Preparation

AFM imaging requires flat surfaces for imaging. However, polymer samples may require additional sample preparation beyond this. If there is a sample with a "skin", or a sample that has been processed and only the inner bulk material needs to be imaged, it may help to use a micro tome for sample prep. Microtoming is a process by which a very smooth surface is cut and prepared. Many samples such as thin films or spin-coated films can be imaged as is without this preparation.

Aside from microtoming, no further sample preparation is required – i.e. no staining is required as is the case for electron microscopy based methods such as scanning electron microscopy (SEM) and transmission electron microscopy (TEM).

Our AFM Users Recent Polymer Reference Publications

AFMWorkshop's TT-AFM provides all the major Atomic Force Microscopy (AFM) modes needed to characterize polymers, including vibrating mode for topography/morphology and force distance curves for mechanical properties such as adhesion and stiffness. A number of researchers have published their work on polymers using the TT-AFM, characterizing important properties such as size, shape, and dispersion. Click here  to read our highlights of a few recent articles where researchers are utilizing the TT-AFM for work on polymers in biomedical and electronic device applications.

To learn more about afmworkshop’s atomic force microscopes, feel free to visit www.afmworkshop.com.

[afmworkshop]

Global Delivery Of Atomic Force Microscopes First Class Training. To Know More Visit :  https://afmworkshop.com/

[afmworkshop]

To know more about this please visit : https://www.afmworkshop.com/

[afmworkshop]

To know more visit here : https://www.afmworkshop.com/

[afmworkshop]

AFMWorkshop is confident that our atomic force microscope will be able to run your application, and we guarantee it. Else, we’ll refund the full purchase price of your AFM. Our success is your success, and we will work with you to ensure your productivity using AFMWorkshop’s products. For more information, feel free to visit: https://www.afmworkshop.com/about-us/afm-money-back-guarantee

[afmworkshop]

AFMWorkshop’s atomic force microscopes offer the essential features needed to measure high-quality AFM images, without the additional cost for unnecessary features. For scientists and engineers requiring AFM capability, AFMWorkshop is the leader in value. For more details,visit here: https://www.afmworkshop.com/

[afmworkshop]

Samples are held in place on this scanner with a removable cap. This modified tripod scanner utilizes low voltage piezoelectric ceramics and temperature compensated strain gauges. Connections to the scanner are made with a 20-pin ribbon cable.